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14

ASPDAC
2008
ACM

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78views Hardware» more ASPDAC 2008»

Robust test generation for power supply noise induced path delay faults

13 years 9 months ago

Robust test generation for power supply noise induced path delay faults

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Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li

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Added	12 Oct 2010
Updated	12 Oct 2010
Type	Conference
Year	2008
Where	ASPDAC
Authors	Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li

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