Polynomial Identity Testing for Depth 3 Circuits

We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin. We also show that the rank of a minimal and simple circuit with bounded top fanin, computing zero, can be unbounded. These results answer the open questions posed by Klivans-Spielman (STOC 2001) and Dvir-Shpilka (STOC 2005). Keywords. Identity testing, depth of circuits, Chinese remaindering, rings. Subject classification. Computer Science, Algebra.

• Type: Conference
• Year: 2006
• Where: COCO
• Authors: Neeraj Kayal, Nitin Saxena
• Keywords: Algorithms, COCO 2006, Identity Testing, Identity Testing Problem, Polynomial Time Identity