Sciweavers

    AMCS
    2008
    104views Mathematics» more  AMCS 2008»

    Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

    13 years 11 months ago
    Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images
    Download  matwbn.icm.edu.pl
    Ewa Skubalska-Rafajlowicz
    claim paper
    Added 08 Dec 2010
    Updated 08 Dec 2010
    Type Journal
    Year 2008
    Where AMCS
    Authors Ewa Skubalska-Rafajlowicz
    Comments (0)
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.