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IEICET
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IEICET 2008
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On Fault Testing for Reversible Circuits
13 years 11 months ago
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www.lab.ss.titech.ac.jp
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
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Added
11 Dec 2010
Updated
11 Dec 2010
Type
Journal
Year
2008
Where
IEICET
Authors
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
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