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IEICET
2008

On Fault Testing for Reversible Circuits

13 years 11 months ago
On Fault Testing for Reversible Circuits
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
Added 11 Dec 2010
Updated 11 Dec 2010
Type Journal
Year 2008
Where IEICET
Authors Satoshi Tayu, Shigeru Ito, Shuichi Ueno
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