Measurement of Large Forces and Deflections in Microstructures

Properties of typical MEMS materials have been widely investigated. Mechanical properties of MEMS structures depend not only on the bulk material properties, but also structural factors. A measurement system has been made to measure force/deflection on microstructures to examine some of the structural properties. This is a stylus setup integrated with a load cell and a linear actuator. First, the requirements for the measurement system were established. Then the system was built up and characterized. We have successfully made measurements on a typical micromechanical structure, a cantilever accelerometer design. The stylus placement accuracy, the spring constant along the proof mass, analysis of the force/deflection curve shape and destructive tests on the cantilever have been investigated in our experiment and will be presented in this paper.

• Type: Journal
• Year: 2008
• Where: CORR
• Authors: Kai Axel Hals, Einar Halvorsen, Xuyuan Chen
• Keywords: Bulk Material Properties, CORR 2008, Education, Typical Mems Materials, Typical Micromechanical Structure