Cohesive zone modeling for structural integrity analysis of IC interconnects

13 years 11 months ago

Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.

B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee

Critical Design Criterion | Integrated Circuits | MR 2007 | Robotics | Thermo-mechanical Reliability |

claim paper

Added	27 Dec 2010
Updated	27 Dec 2010
Type	Journal
Year	2007
Where	MR
Authors	B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Geers, Olaf van der Sluis

Comments (0)