ET
2010
13 years 7 months ago
2010
ET
2010
13 years 10 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
ET
2010
13 years 10 months ago
2010
Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant performance improvement through calibration. However, the calibration process often ...
ET
2010
13 years 11 months ago
2010
In this work we investigate the problem of simultaneous privacy and integrity protection in cryptographic circuits. We consider a white-box scenario with a powerful, yet limited at...
ET
2010
13 years 11 months ago
2010
—Designers often apply manual or semi-automatic loop and data transformations on array and loop intensive programs to improve performance. For the class of static affine program...
ET
2010
13 years 11 months ago
2010
ET
2010
13 years 11 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ET
2010
13 years 11 months ago
2010