Local Tomography in Electron Microscopy

We present a new local tomographic algorithm applicable to electron microscope tomography. Our algorithm applies to the standard data acquisition method, single-axis tilting, as well as to more arbitrary acquisition methods including double axis and conical tilt. Using microlocal analysis we put the reconstructions in a mathematical context, explaining which singularities are stably visible from the limited data given by the data collection protocol in the electron microscope. Finally, we provide reconstructions of real specimens from electron tomography data. Key words. X-ray transform, limited data tomography, microlocal analysis, Lambda tomography, electron tomography AMS subject classifications. Primary, 44A12, 92C55; Secondary, 65R30, 35S30 DOI. 10.1137/07068326X

• Type: Journal
• Year: 2008
• Where: SIAMAM
• Authors: Eric Todd Quinto, Ozan Öktem
• Keywords: Acquisition Methods, Electron, SIAMAM 2008, Tomography