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Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices

13 years 6 months ago
Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices
David J. Smith, David A. Cullen, Lin Zhou, Martha
Added 20 May 2011
Updated 20 May 2011
Type Journal
Year 2010
Where MR
Authors David J. Smith, David A. Cullen, Lin Zhou, Martha R. McCartney
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