Yield prediction for 3D capacitive interconnections

Capacitive interconnections are very promising structures for high-speed and low-power signaling in 3D packages. Since the performance of AC links, in terms of Band-Width and Bit-Error-Rate (BER), depends on assembly and synchronization accuracy we performed a statistical analysis of assembly procedures and communication circuits. In this paper we present a yield prediction methodology for 3D capacitive links: starting from the analysis of communication circuits and BER measurements, we analyze stacking variability in order to predict reliability and performance. The proposed parametric yield analysis is demonstrated on a test-case, with constrained inter-electrode coupling and operating frequency.

• Type: Conference
• Year: 2006
• Where: ICCAD
• Authors: Alberto Fazzi, L. Magagni, Mario de Dominicis, Paolo Zoffoli, Roberto Canegallo, Pier Luigi Rolandi, Alberto L. Sangiovanni-Vincentelli, Roberto Guerrieri
• Keywords: Communication Circuits, Hardware, ICCAD 2006, Parametric Yield Analysis, Yield Prediction Methodology