N-distinguishing Tests for Enhanced Defect Diagnosis

Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets, which distinguish pairs of single stuck-at faults n times, to enhance the probability of distinguishing unmodeled defects. The basis for the use of n-distinguishing test sets to enhance defect diagnosis is similar to that for using n-detection test sets to improve the detection of unmodeled defects. We use a heuristic to target a subset of fault pairs for n-distinguishing in order to improve the efficacy of the patterns generated for aiding diagnosis. Experimental results on the larger ISCAS benchmark circuits are presented to demonstrate the improvements in defect diagnostic resolution due to the use of n-distinguishing test sets. We use randomly selected resistive bridges to represent unmodeled defects. The experimental results also show that the coverage of unmodeled defects by ndistinguishing test sets i...

• Type: Conference
• Year: 2009
• Where: ATS
• Authors: Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz
• Keywords: ATS 2009, Hardware, N-detection Test Sets, N-distinguishing Test Sets, Test Sets