PTS
2010
13 years 10 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...
TCAD
2008
13 years 11 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
NIPS
2004
14 years 27 days ago
2004
The NIPS 2003 workshops included a feature selection competition organized by the authors. We provided participants with five datasets from different application domains and calle...
SNPD
2008
14 years 28 days ago
2008
This paper presents a single project experiment on the fault revealing capabilities of model-based test sets. The tests are generated from UML statecharts and UML sequence diagram...
FORTEST
2008
14 years 1 months ago
2008
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
ICCAD
1995
IEEE
14 years 3 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
ICECCS
2000
IEEE
14 years 3 months ago
2000
IEEE
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
GECCO
2006
Springer
14 years 3 months ago
2006
Springer
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...