This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...
Neil Walkinshaw, Kirill Bogdanov, John Derrick, Ja...
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
The NIPS 2003 workshops included a feature selection competition organized by the authors. We provided participants with five datasets from different application domains and calle...
Isabelle Guyon, Steve R. Gunn, Asa Ben-Hur, Gideon...
This paper presents a single project experiment on the fault revealing capabilities of model-based test sets. The tests are generated from UML statecharts and UML sequence diagram...
Supaporn Kansomkeat, Jeff Offutt, Aynur Abdurazik,...
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...
Michael A. Kochte, Christian G. Zoellin, Michael E...
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Je...
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...
Salah Bouktif, Giuliano Antoniol, Ettore Merlo, Ma...