A novel self-healing methodology for RF Amplifier circuits based on oscillation principles

— This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The selfgenerated test signature from the DUT is analyzed by using onchip resources for testing the LNA and controlling its calibration knobs to compensate for multi-parameter variations in the LNA manufacturing process. Thus, the proposed methodology enables self-test and self-calibration of RF circuits without the need for external test stimulus. The proposed methodology is demonstrated through simulations as well as measurements performed on a RF LNA.

• Type: Conference
• Year: 2009
• Where: DATE
• Authors: Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee
• Keywords: DATE 2009, Embedded Rf Amplifiers, Hardware, Methodology, Test Signature