2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue

—A new 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without suffering gateoxide reliability issue is proposed, which is one of the key mixedvoltage I/O cells in a cell library. The proposed circuit is realized with only thin gate-oxide devices with floating n-well technique. The proposed 2xVDD-tolerant crystal oscillator circuit has been designed and verified in a 90-nm 1-V CMOS process to serve 1/2-V mixed-voltage interface applications.

• Type: Conference
• Year: 2008
• Where: ISCAS
• Authors: Ming-Dou Ker, Tzu-Ming Wang, Hung-Tai Liao
• Keywords: 2xVDD-tolerant Crystal Oscillator, CMOS Devices, Crystal Oscillator Circuit, Hardware, ISCAS 2008