CORR
2007
Springer
14 years 18 days ago
2007
Springer
: New nanotechnology based devices are replacing CMOS devices to overcome CMOS technology’s scaling limitations. However, many such devices exhibit nonmonotonic I-V characteristi...
GLVLSI
2006
IEEE
14 years 6 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
ISCAS
2008
IEEE
14 years 7 months ago
2008
IEEE
—A new 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without suffering gateoxide reliability issue is proposed, which is one of the key mixedvoltage ...