A 4-Bits Trimmed CMOS Bandgap Reference with an Improved Matching Modeling Design

—Component tolerances and mismatches due to process variations severely degrade the performance of bandgap reference (BGR) circuits. In this paper, we describe the design of a BGR considering the Pelgrom’s mismatch model. The main purpose of our methodology is to convey the design to reach a good trade-off between area and mismatch. Implemented in standard 0.35µm CMOS technology, our circuit also includes a straightforward 4-bits trimming circuit to achieve more process variations independence. Its Monte Carlo temperature coefficient average is 40-ppm/ºC and the reference output

• Type: Conference
• Year: 2007
• Where: ISCAS
• Authors: Juan Pablo Martinez Brito, Sergio Bampi, Hamilton Klimach
• Keywords: ISCAS 2007, Pelgrom’s Mismatch Model, Process Variations, Process Variations Independence