3-D Shape Measurement Method with Modulated Slit Light Robust for Interreflection and Subsurface Scattering

We propose a method to accurately measure the shape of objects by suppressing the effect of indirect reflection caused by the interreflection and subsurface scattering. We use a M-sequence pattern shifted along the line of the slit light, and the sequence of captured images is analyzed using synchronous demodulator. This method utilizes two properties of indirect reflection; one is the transfer characteristics of higher spatial frequency components, and the other is geometric constraint between the projector and the camera. Prior to the measurement, epipolar constraint is obtained through calibration, and then the phase consistency is evaluated to suppress the interreflection. The cross-correlation value is also used to suppress the dilation of the slit light caused by the subsurface scattering.

• Type: Conference
• Year: 2009
• Where: PROCAMS
• Authors: Tatsuhiko Furuse, Shinsaku Hiura, Kosuke Sato
• Keywords: 3-D Measurement, Global Illumination, Interreflection, Subsurface Scattering