—Component tolerances and mismatches due to process variations severely degrade the performance of bandgap reference (BGR) circuits. In this paper, we describe the design of a BGR considering the Pelgrom’s mismatch model. The main purpose of our methodology is to convey the design to reach a good trade-off between area and mismatch. Implemented in standard 0.35µm CMOS technology, our circuit also includes a straightforward 4-bits trimming circuit to achieve more process variations independence. Its Monte Carlo temperature coefficient average is 40-ppm/ºC and the reference output