An accurate flip-flop selection technique for reducing logic SER

The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In particular, the effects of these errors on logic nodes are predicted to play an increasingly large role in determining the overall failure rate of future VLSI chips. While a myriad of techniques have been proposed to mitigate the effects of soft errors, system designers must ensure that the application of these solutions does not come at the expense of other design goals. This work presents a heuristic to selectively apply temporal redundancy to flip-flops within a pipelined logic unit, achieving significant reductions in failures associated with soft errors with minimal overhead.

• Type: Conference
• Year: 2008
• Where: DSN
• Authors: Eric L. Hill, Mikko H. Lipasti, Kewal K. Saluja
• Keywords: Computer Networks, DSN 2008, On-chip Transistor Densities, Significant Design Concern, Soft Errors