DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
Our society is heavily dependent on a wide variety of communication services. These services must be available even when undesirable events like sabotage, natural disasters, or ne...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
XOR-based erasure codes are a computationallyefficient means of generating redundancy in storage systems. Some such erasure codes provide irregular fault tolerance: some subsets o...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
CMOS technology trends are leading to an increasing incidence of hard (permanent) faults in processors. These faults may be introduced at fabrication or occur in the field. Wherea...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
Fault-tolerant, replicated file systems are a crucial component of today's data centers. Despite their huge complexity, these systems are typically specified only in brief pr...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
Software vulnerabilities are the root cause of a wide range of attacks. Existing vulnerability scanning tools are able to produce a set of suspects. However, they often suffer fro...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
We describe a specific application of assurance cases to the problem of ensuring that a transition from a legacy system to its replacement will not compromise mission assurance ob...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
Interactive applications such as email, calendar, and maps are migrating from local desktop machines to data centers due to the many advantages offered by such a computing environ...
DSN
2008
IEEE
14 years 5 months ago
2008
IEEE
The long-term availability of data stored in a file system depends on how well it safeguards on-disk pointers used to access the data. Ideally, a system would correct all pointer...
DSN
2008
IEEE
14 years 5 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...