MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering ...
TDSC
2010
13 years 10 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
VLSISP
2008
13 years 11 months ago
2008
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
ASPDAC
2005
ACM
14 years 1 months ago
2005
ACM
Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicati...
CASES
2006
ACM
14 years 3 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
FPL
2009
Springer
14 years 4 months ago
2009
Springer
This paper proposes a coarse-grained dynamically reconfigurable architecture, which offers flexible reliability to soft errors and aging. A notion of cluster is introduced as a ...
LCTRTS
2010
Springer
14 years 4 months ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
DSN
2002
IEEE
14 years 4 months ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
EMSOFT
2005
Springer
14 years 5 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...