Adaptive Diagnostic Pattern Generation for Scan Chains

Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, a SAT-based technique is proposed to adaptively generate patterns to diagnose stuck-at faults in scan chains. Experimental results on ISCAS'89 benchmark circuits show that the proposed method can dramatically reduce the number of diagnostic patterns while obtain high diagnosis resolution.

• Type: Conference
• Year: 2008
• Where: DELTA
• Authors: Fei Wang, Yu Hu, Xiaowei Li
• Keywords: DELTA 2008, Information Management, SAT-based Technique, Scan Chain Failures, Scan Chains