An ADC-BiST scheme using sequential code analysis

This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysis method is an alternative to histogram based analysis techniques to provide test time improvements, especially when the resources are scarce. In addition to the measurement of DNL and INL, non-monotonic behavior can also be detected with the proposed technique. We present two implementation options based on how much on-chip resources are available. The ramp generator has a high linearity over a full-scale range of 1V and the generated ramp signal is capable of testing 13 − bit ADCs. The circuit implementation of the ramp generator utilizes a feedback configuration to improve the linearity having an area of 0.017mm2 in 0.5µm process.

• Type: Conference
• Year: 2007
• Where: DATE
• Authors: Erdem Serkan Erdogan, Sule Ozev
• Keywords: DATE 2007, Generated Ramp Signal, Hardware, Linear Ramp Generator, Ramp Generator