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    DATE
    2007
    IEEE
    138views Hardware» more  DATE 2007»
    An ADC-BiST scheme using sequential code analysis
    15 years 13 days ago
    An ADC-BiST scheme using sequential code analysis
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    This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
    Erdem Serkan Erdogan, Sule Ozev
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