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27

ITC
1994
IEEE

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An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms

14 years 3 months ago

An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms

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Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza

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Hardware | ITC 1994 |

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Added	27 Aug 2010
Updated	27 Aug 2010
Type	Conference
Year	1994
Where	ITC
Authors	Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda

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