Selecting partial scan flip-flops for circuit partitioning

This paper presents a new method of selecting scan ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned into many small subcircuits which can be dealt with separately by a test pattern generator. This permits easy automatic test pattern generation for arbitrarily large sequential circuits. Algorithms of selecting scan FFs to allow such partitioning and of scheduling tests for subcircuits are given. Experimental results show that the proposed method makes it possible to generate test patterns for extra large sequential circuits which previous approaches cannot deal with.

• Type: Conference
• Year: 1994
• Where: ICCAD
• Authors: Toshinobu Ono
• Keywords: Hardware, ICCAD 1994, Large Sequential Circuits, Scan Ffs, Sequential Circuits