A Case Study of IR-Drop in Structured At-Speed Testing

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At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful application of structural atspeed tests. In this paper we characterize these problems on commercial ASICs in order to understand how to implement more eﬀective solutions.

Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya

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Hardware | ITC 2003 | Mode Switching Activity | Present Special Challenges | Structural Atspeed Tests |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger

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A Case Study of IR-Drop in Structured At-Speed Testing

Hardware | ITC 2003 | Mode Switching Activity | Present Special Challenges | Structural Atspeed Tests |

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