A Case Study of IR-Drop in Structured At-Speed Testing

At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful application of structural atspeed tests. In this paper we characterize these problems on commercial ASICs in order to understand how to implement more effective solutions.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger
• Keywords: Hardware, ITC 2003, Mode Switching Activity, Present Special Challenges, Structural Atspeed Tests