Clock domain crossing fault model and coverage metric for validation of SoC design

Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensive tasks in the SoC design process. Simulation on register transfer level (RTL) is still the most widely used method. It is important to quantitatively measure the validation confidence and progress for clock domain crossing (CDC) designs. In this paper, we propose an efficient method for definition of CDC coverage, which can be used in RTL simulation for a multi-clock domain SoC design. First, we develop a CDC fault model to present the actual effect of metastability. Second, we use a temporal data flow graph (TDFG) to propagate the CDC faults to observable variables. Finally, CDC coverage is defined based on the CDC faults and their observability. Our experiments on a commercial IP demonstrate that this method is useful to find CDC errors early in the design cycles.

• Type: Conference
• Year: 2007
• Where: DATE
• Authors: Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng
• Keywords: CDC Coverage, Cdc Faults, DATE 2007, Hardware, SoC Design