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DATE
2007
IEEE
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DATE 2007
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Clock domain crossing fault model and coverage metric for validation of SoC design
14 years 5 months ago
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Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng
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