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DATE
2007
IEEE
123views Hardware» more  DATE 2007»
14 years 1 months ago
Clock domain crossing fault model and coverage metric for validation of SoC design
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng