Cost-effective radiation hardening technique for combinational logic

— A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates that have the lowest logical masking probability to achieve cost-effective tradeoffs between overhead and soft error failure rate reduction. The technique, which decouples the physical from the logical aspects of soft error susceptibility of a gate, uses a novel gate (transistor) sizing technique that is both efficient and accurate (in comparison to SPICE). A full set of experimental results demonstrate the cost-effective tradeoffs that can be achieved.

• Type: Conference
• Year: 2004
• Where: ICCAD
• Authors: Quming Zhou, Kartik Mohanram
• Keywords: Hardware, ICCAD 2004, Logical Masking Probabilities, Logical Masking Probability, Radiation Hardening Technique