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    1999
    IEEE
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    Delay testing of SOI circuits: Challenges with the history effect

    14 years 4 months ago
    Delay testing of SOI circuits: Challenges with the history effect
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    Eric MacDonald, Nur A. Touba
    claim paper
    Added 04 Aug 2010
    Updated 04 Aug 2010
    Type Conference
    Year 1999
    Where ITC
    Authors Eric MacDonald, Nur A. Touba
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