| Design for testability using register-transfer level partial scan selection Recent countries visiting this post |  |
 | 3 | United States |
 | 1 | |
 | 1 | Germany |
 | 1 | Japan |
| Design for testability using register-transfer level partial scan selection Recent countries visiting this post | |
| 3 | United States |
| 1 | |
| 1 | Germany |
| 1 | Japan |