Detecting Intra-Word Faults in Word-Oriented Memories

This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establishes the data background sequence (DBS) for each intraword coupling fault. These DBSs will be compiled into a ´½ · ¾ £ ÐÓ ¾ µ £ Ò test with complete fault coverage of the target faults, where Ò is the size of the memory and the word size. The test length can be reduced to ¾ £ Ò when the intra-word faults are restricted to physical adjacent cells within a word.

• Type: Conference
• Year: 2003
• Where: VTS
• Authors: Said Hamdioui, A. J. van de Goor, Mike Rodgers
• Keywords: Coupling Fault, Intra-word Coupling Faults, Intraword Coupling Fault, VTS 2003