DFFT : Design For Functional Testability

Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC on an ATE. Taking these mechanisms into account during the design process of a chip can substantially reduce the efforts needed to make functional tests work. We call this process design for functional testability (DFFT).

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Haluk Konuk, Leon Xiao
• Keywords: Functional Test Failures, Functional Tests, Fundamental Mechanisms, Hardware, ITC 2003