Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutiona

Kth increasing uncertainties in the modeling and pmcessing of semiconductor devices, it is essential that the sources of failures be identified once the devices ure manufactured In this papel: we present a methodology to diagnose thepmblems in broadbandamplifiersby determiningthe most important smallsignal parameters of the internal Iransistors. We use an evolutionary algarithm specifically designed to mimic the expecled errors to ensure f a t convergence to the correct solution. Sensitivity analysis is used Io determine the se1 of the most impactful small signalparameters and toguide the evolutionarysearch. Experimentalresults indicare the proposed algorithm determines the parameters accurately and ir scales well in terms of accuracy andcomputation time.

• Type: Conference
• Year: 2004
• Where: ICCAD
• Authors: Fang Liu, Sule Ozev, Martin A. Brooke
• Keywords: Hardware, ICCAD 2004, Impactful Small Signalparameters, Important Smallsignal Parameters, Kth Increasing Uncertainties