Exploiting Structural Duplication for Lifetime Reliability Enhancement

Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In this paper, we study two techniques that leverage microarchitectural structural redundancy for lifetime reliability enhancement. First, in structural duplication (SD), redundant microarchitectural structures are added to the processor and designated as spares. Spare structures can be turned on when the original structure fails, increasing the processor’s lifetime. Second, graceful performance degradation (GPD) is a technique which exploits existing microarchitectural redundancy for reliability. Redundant structures that fail are shut down while still maintaining functionality, thereby increasing the processor’s lifetime, but at a lower performance. Our analysis shows that exploiting structural redundancy can provide significant reliability benefits, and we present guidelines for efficient usage of the...

• Type: Conference
• Year: 2005
• Where: ISCA
• Authors: Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers
• Keywords: Hardware, ISCA 2005, Lifetime Reliability, Lifetime Reliability Enhancement, Lifetime Reliability Problems