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With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperature...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating...
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse im...
With the relentless scaling of semiconductor technology, the lifetime reliability of embedded multiprocessor platforms has become one of the major concerns for the industry. If th...
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...