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    On Fault Testing for Reversible Circuits

    13 years 11 months ago
    On Fault Testing for Reversible Circuits
    Download  www.lab.ss.titech.ac.jp
    Satoshi Tayu, Shigeru Ito, Shuichi Ueno
    claim paper
    Added 11 Dec 2010
    Updated 11 Dec 2010
    Type Journal
    Year 2008
    Where IEICET
    Authors Satoshi Tayu, Shigeru Ito, Shuichi Ueno
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