ICCAD
1996
IEEE
14 years 3 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
ITC
2000
IEEE
14 years 4 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
GLVLSI
2003
IEEE
14 years 4 months ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
DAC
2000
ACM
15 years 17 days ago
2000
ACM