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ITC
1996
IEEE

Identification and Test Generation for Primitive Faults

14 years 3 months ago
Identification and Test Generation for Primitive Faults
Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad
Added 07 Aug 2010
Updated 07 Aug 2010
Type Conference
Year 1996
Where ITC
Authors Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar
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