Impact of Multiple-Detect Test Patterns on Product Quality

This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizing the coverage of node-tonode bridging defects. Volume data obtained by testing a production ASIC with these new multipledetect patterns shows increased defect screening capability and very good agreement with the bridging coverage estimated by the ATPG tool.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
• Keywords: ATPG Tool, Hardware, ITC 2003, Multiple-detect Test Patterns, Node-tonode Bridging Defects