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32

VLSID
2002
IEEE

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Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST

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Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST

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Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Raj

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Computer Architecture | Constructive Multi-Phase Test | VLSID 2002 |

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Added	01 Dec 2009
Updated	01 Dec 2009
Type	Conference
Year	2002
Where	VLSID
Authors	Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Rajski

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