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VLSID
2002
IEEE

Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST

14 years 11 months ago
Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST
Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Raj
Added 01 Dec 2009
Updated 01 Dec 2009
Type Conference
Year 2002
Where VLSID
Authors Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Rajski
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