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    VLSID
    2002
    IEEE
    82views VLSI» more  VLSID 2002»
    Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST
    14 years 11 months ago
    Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST
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    Nadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Raj...
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