Incremental Diagnosis of Multiple Open-Interconnects

With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-life behavior. In this work, we present an efficient diagnostic technique for multiple openinterconnects. The algorithm proceeds in two phases. During the first phase, potential solution sets are identified following a model-free incremental diagnosis methodology. Heuristics are devised to speed up this step and screen the solution space efficiently. In the second phase, a generalized fault simulation scheme enumerates all possible faulty behaviors for each solution from the first phase. We conduct experiments on combinational and full-scan sequential circuits with one, two and three open faults. The results are very encouraging.

• Type: Conference
• Year: 2002
• Where: ITC
• Authors: Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi
• Keywords: Chip Interconnect Distances, Hardware, ITC 2002, Non-deterministic Real-life Behavior, first Phase