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AMCS
2008

Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

14 years 17 days ago
Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images
Ewa Skubalska-Rafajlowicz
Added 08 Dec 2010
Updated 08 Dec 2010
Type Journal
Year 2008
Where AMCS
Authors Ewa Skubalska-Rafajlowicz
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