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ASPDAC
2006
ACM

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Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability

14 years 3 months ago

Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability

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Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand

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ASPDAC 2006 | Flip-flops | Hardware | Low-overhead Flip-flops | Soft Error |

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Added	20 Aug 2010
Updated	20 Aug 2010
Type	Conference
Year	2006
Where	ASPDAC
Authors	Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand, Kaushik Roy

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