A mixed mode BIST scheme based on reseeding of folding counters

In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson counter and is called folding counter. Both the theoretical background and practical algorithms are presented to characterize a set of deterministic test cubes by a reasonably small number of seeds for a folding counter. Combined with classical approaches for test width compression and with pseudorandom pattern generation these new techniques provide an efficient and flexible solution for scan-based BIST. Experimental results show that the proposed scheme outperforms previously published approaches based on the reseeding of LFSRs or Johnson counters.

• Type: Conference
• Year: 2000
• Where: ITC
• Authors: Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang
• Keywords: Folding Counter, Hardware, ITC 2000, Johnson Counters, Scan-based Bist