Optimized self-tuning for circuit aging

We present a framework and control policies for optimizing dynamic control of various self-tuning parameters over lifetime in the presence of circuit aging. Our framework introduces dynamic cooling as one of the self-tuning parameters, in addition to supply voltage and clock frequency. Our optimized self-tuning satisfies performance constraints at all times and maximizes a lifetime computational power efficiency (LCPE) metric, which is defined as the total number of clock cycles achieved over lifetime divided by the total energy consumed over lifetime. Our framework features

• Type: Conference
• Year: 2010
• Where: DATE
• Authors: Evelyn Mintarno, Joelle Skaf, Rui Zheng, Jyothi Velamala, Yu Cao, Stephen P. Boyd, Robert W. Dutton, Subhasish Mitra
• Keywords: DATE 2010, Hardware, Optimized Self-tuning Satisfies, Self-tuning Parameters, Various Self-tuning Parameters