Parameter variations and impact on circuits and microarchitecture

Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented. Categories and Subject Descriptors B.7.1 Microprocessors and microcomputers, VLSI. General Terms: Design, Performance, Reliability.

• Type: Conference
• Year: 2003
• Where: DAC
• Authors: Shekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De
• Keywords: DAC 2003, Descriptors B.7.1 Microprocessors, Design Automation, Parameter Variations