Partial Detectability Profiles

Partial detectability profiles are formed by randomly sampling each fault's detectability and are used in estimating the fault coverage of random input test vectors on combinational circuits. Partial detectability profiles are particularly useful for predicting fault coverage for large circuits with a large number of inputs. Predictions made using full and partial detectability profiles are compared.

• Type: Conference
• Year: 1990
• Where: ICCAD
• Authors: Paul G. Ryan, W. Kent Fuchs
• Keywords: Fault Coverage, Fault's Detectability, Hardware, ICCAD 1990, Partial Detectability Profiles